China Model Dw-Ftir-520A Fourier Transform Infrared Spectrometer That Lab Equipment with High Resolution

DW-FTIR-510A/520A FT-IR Spectrometer
FEATURES:
New type cube-corner Michelson interferometer features smaller size and more compact structure, providing higher stability and less sensitive to vibrations and thermal variations than conventional Michelson interferometer.Fully sealed damp and dust- proof interferometer, adopting high performance, long lifetime sealing material and desiccator, ensures higher adaptability to the environment and increases accuracy and reliability in operation. Viewable window for silica gel enables easy observation and replacement.Isolated IR source and large space heat dissipation chamber design provides higher thermal stability. Stable interference is obtained without the need of dynamic adjustment.High intensity IR source adopts a reflex sphere to obtain even and stable IR radiation.Super wide sample compartment provides more flexibility to accommodate various accessories.The application of programmable gain amplifier, high accuracy A/D converter and embedded computer improves the accuracy and reliability of the whole system.The spectrometer connects to PC via a USB port for automatic control and data communication, fully realizing plug-and-play operation.Compatible PC control with user friendly, rich function software enables easy, convenient and flexible operation. Spectrum collect, spectrum conversion, spectrum processing, spectrum analyzing, and spectrum output function etc. can be performed.Various special IR libraries are available for routine search. Users can also add and maintain the libraries or set up new libraries by themselves.Accessories such as Defused/Specular Reflection, ATR, Liquid cell, Gas cell, and IR microscope etc can be mounted in the sample compartment.
SPECIFICATIONS:Spectral Range: 7800 to 350 cm-1Resolution: better than 0.85cm-1 ( FTIR-510A)Better than 0.5cm-1 (FTIR-520A)Wavenumber Precision: ±0.01cm-1Scanning Speed: 5-step adjustable for different applicationsSignal to noise ratio:better than 15,000:1 (RMS value, at 2100cm-1, resolution: 4cm-1, detector: DTGS, 1 minute data collection)Beam splitter: Ge coated KBrInfrared Source: Air-cooled, high efficiency Reflex Sphere moduleDetector: DTGSData system:Compatible computerSoftware: FT-IR software contains all routines needed for basic spectrometer operations, including library search, quantitation and spectrum exportIR Library11 IR libraries includedDimensions: 54x52x26cmWeight: 28kg
ACCESSORIES
Diffuse/Specular Reflectance Accessory
It is a versatile diffuse reflectance and specular reflectance accessory. Diffuse reflection mode is used for transparent and powder sample analysis. Specular reflection mode is for measuring smooth reflective surface and coating surface.High light throughputEasy operation, no internal adjustment neededOptical aberration compensationSmall light spot, able to measure micro samplesVariable angle of incidenceFast change of powder cup
Horizontal ATR /Variable Angle ATR (30°~ 60°)
Horizontal ATR is suitable for the analysis of rubber, viscous liquid, large surface sample and pliable solids etc. Variable angle ATR is used for measurement of films, painting (coating) layers and gels etc.Easy installation and operationHigh light throughputVariable depth of IR penetration
IR MicroscopeMicro samples analysis, minimum sample size: 100µm (DTGS detector) and 20µm (MCT detector) Non-destructive sample analysisTranslucent sample analysisTwo measurement methods: transmission and reflectionEasy sample preparation
Single Reflection ATR
It provides high throughput when measuring materials with high absorption, such as polymer, rubber, lacquer, fiber etc.High throughputEasy operation and high analytical efficiencyZnSe, Diamond, AMTIR, Ge and Si crystal plate can be selected according to application.
Accessory for Determination of Hydroxyl in IR QuartzFast, convenient and accurate measurement of Hydroxyl content in IR quartzDirect measurement to IR quartz tube, no need to cut samplesAccuracy: ≤ 1x10-6 (≤ 1ppm)
Accessory for Oxygen and Carbon in Silicon Crystal DeterminationSpecial silicon plate holderAutomatic, fast and accurate measurement of oxygen and carbon in silicon crystalLower detection limit: 1.0x1016 cm-3 ( at room temperature)Silicon plate thickness: 0.4~4.0 mm
SiO2 Powder Dust Monitoring AccessorySpecial SiO2 powder dust monitoring softwareFast and accurate measurement of SiO2 powder dust
Component Testing AccessoryFast and accurate measurement of the response of such components as MCT, InSb and PbS etc.Curve, peak wavelength, stop wavelength and D* etc can be presented.
Optic Fiber testing AccessoryEasy and accurate measurement of the loss rate of IR optic fiber, overcoming the difficulties for fiber testing, since they are very thin, with very small light-passing holes and uneasy to fix.
Jewelry Inspection AccessoryAccurate identification of jewelries.
Universal AccessoriesFixed liquid cells and demountable liquid cellsGas cells with different pathlength